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Product | ISO 24688:2022 | ||
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Price | Price USD 69.00 | ||
Rating | Rating | ||
Buy | Buy Add to Cart | ||
Description |
Description
This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD). |
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Standard Number | Standard Number ISO 24688:2022 | ||
Title | Title ISO 24688:2022 Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods | ||
Status | Status Published | ||
Publication Date | Publication Date 22 Jul 2022 | ||
Cross References | Cross References | ||
Descriptors | Descriptors | ||
ICS | ICS 25.220.01 | ||
Committee | Committee ISO/TC 107/SC 9 Physical vapor deposition coatings | ||
ISBN | ISBN | ||
Publisher | Publisher PECB Store | ||
Format | Format PDF | ||
Delivery | Delivery NO | ||
Pages | Pages 8 | ||
File Size | File Size KB |