ISO 24688

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ISO 24688:2022

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ISO 24688:2022 Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods

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This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).

Standard Number ISO 24688:2022
Title ISO 24688:2022 Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods
Status Published
Publication Date 22 Jul 2022
Committee ISO/TC 107/SC 9 Physical vapor deposition coatings
Publisher PECB Store
Format PDF
Pages 8
Price $ 61.00
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