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Product Product ISO 23729:2022
Price Price USD 106.00
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Description Description

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

Standard Number Standard Number ISO 23729:2022
Title Title ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Status Status Published
Publication Date Publication Date 13 Jul 2022
Cross References Cross References
Descriptors Descriptors
ICS ICS 71.040.40
Committee Committee ISO/TC 201/SC 9 Scanning probe microscopy
ISBN ISBN
Publisher Publisher PECB Store
Format Format PDF
Delivery Delivery NO
Pages Pages 15
File Size File Size KB