ISO 23729

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ISO 23729:2022

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ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

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USD 106.00

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

Standard Number ISO 23729:2022
Title ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Status Published
Publication Date 13 Jul 2022
Committee ISO/TC 201/SC 9 Scanning probe microscopy
Publisher PECB Store
Format PDF
Pages 15
Price USD 106.00
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