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ISO/TS 22933:2022
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| Price | Price USD 106.00 | ||
| Rating | Rating | ||
| Buy | Buy Add to Cart | ||
| Description |
Description
This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes. |
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| Standard Number | Standard Number ISO/TS 22933:2022 | ||
| Title | Title ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS | ||
| Status | Status Published | ||
| Publication Date | Publication Date 01 Apr 2022 | ||
| Cross References | Cross References | ||
| Descriptors | Descriptors | ||
| ICS | ICS 71.040.40 | ||
| Committee | Committee ISO/TC 201/SC 6 Secondary ion mass spectrometry | ||
| ISBN | ISBN | ||
| Publisher | Publisher PECB Store | ||
| Format | Format PDF | ||
| Delivery | Delivery NO | ||
| Pages | Pages 15 | ||
| File Size | File Size KB |
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