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IEC TS 62607-9-1:2021
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| Price | Price USD 383.00 | ||
| Rating | Rating | ||
| Buy | Buy Add to Cart | ||
| Description |
Description
IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials. |
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| Standard Number | Standard Number IEC TS 62607-9-1:2021 | ||
| Title | Title IEC TS 62607-9-1:2021 Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy | ||
| Status | Status Published | ||
| Publication Date | Publication Date 14 Oct 2021 | ||
| Cross References | Cross References | ||
| Descriptors | Descriptors | ||
| ICS | ICS 07.120 | ||
| Committee | Committee TC 113 - Nanotechnology for electrotechnical products and systems | ||
| ISBN | ISBN | ||
| Publisher | Publisher PECB Store | ||
| Format | Format PDF | ||
| Delivery | Delivery NO | ||
| Pages | Pages 63 | ||
| File Size | File Size KB |
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