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IEC TS 62607-6-11:2022 Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
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IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic• defect density nDof graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by• Raman spectroscopy
IEC TS 62607-6-11:2022
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